Browse Items

Viewing items matching the following properties:

• technique : Atomic Force Microscopy  [x]
• manufacturer : Bruker  [x]
• Organisational Unit : London Centre for Nanotechnology  [x]

• 

  Dimension 3100 AFM

  The Dimension 3100 utilises standard and advanced SPM imaging modes for measuring semiconductor wafers, lithography masks, magnetic media, biomaterials, optics and other materials
  more details »
• 

  Dimension FastScan

  The Dimension FastScan uses a low noise FastScan scanner and utilises PeakForce Tapping™ technology to provide new information, faster results and greatly improved ease of use in air or liquid.
  more details »
• 

  Dimension Icon

  The Dimension Icon utilises PeakForce Tapping™ technology to provide new information, faster results and greatly improved ease of use in air or liquid.
  more details »